Call for Papers

NATW-2018 Information

When: 7th – 9th May, 2018

Where: Essex Resort & Spa, Essex, Vermont

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 27th NATW will feature a tutorial on Monday on the subject of verification. In addition to traditional topics, the 27th NATW will feature a general theme of “Silicon Photonics.”

Major topics can include, but are not limited to:

  • Analog, Mixed Signal & RF Testing
  • Built-In Self-Test (BIST)
  • Board and Package Level Testing
  • Delay & Performance Testing
  • Design Verification/Validation
  • Diagnosis and Debug
  • Fault Modeling/Simulation
  • FPGA & Embedded Core Testing
  • IDDQ Testing
  • Machine Learning for Testing
  • DFM, Defect Analysis & Defect-Based Testing
  • Multi-Chip Module Testing
  • Memory & MEMS Testing
  • Nanotechnology Testing
  • Online Testing
  • System-on-Chip (SOC) Test & Debug
  • Test Quality/System Reliability
  • Test Resource Partitioning
  • Testing for Soft Errors/Defects

Important Dates:

  • Submission – 03/02/2018
  • Notification of acceptance – 04/06/2018
  • Submission of final papers – 04/25/2018
  • Submission of PPT presentations – 05/02/2018

Full Call-for-Papers:

NATW2018 Call for Papers