IEEE
  • Important Dates:

    Early Registration: May 2, 2014

    Room Reservation: May 1, 2014

NATW

May 14th – 16th, 2014 Call for Participation

 

Register Now

 

2014 IEEE North Atlantic Test Workshop (NATW)

 
To reserve a Hotel Room at the negotiated rate, please use promo code “NATW14”
 
Traditions At The Glen
Resort and Conference Center
Binghamton, NY
 
Corporate/Academic Supporter packages available for 2014
 

Call_for_Papers

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs.  Topics are not limited to, but can include the following:

Analog, Mixed Signal & RF

Testing Board Level Testing

Delay & Performance Testing

Design Verification/Validation

Diagnosis and Debug

DFM, Defect Analysis & Defect-Based Testing

Memory & MEMS Testing

Online Testing

System-on-Chip (SoC) Test & Debug

FPGA & Embedded Core Testing

Fault Modeling/Simulation

Test Quality/System Reliability

Testing for Soft Errors/Defects

Nanotechnology Testing

IDDQ Testing

 

Program Highlights

 

Wednesday Half Day Tutorial: “Core Based SoC Hierarchical Test: The Methodologies and Industry Practice”

Speakers: Brion Keller (Cadence Design Systems) and Yu Huang (Mentor Graphics).
Tutorial is free to registered NATW-2014 attendees.
 

Wednesday Evening Panel Session: “Does P1687 bring something to the table not in IEEE 1149.1-2013?”

Panel Chair: Eugene Atwood, IBM
Organizer: Yu Huang, Mentor Graphics
 

Thursday Keynote by Prof. Mark (Mohammad) Tehranipoor, PhD, University of Connecticut

Thursday Invited Address: “CloudTestingTM Service, a revolutionary concept for Post-silicon validation,” by Mani Balaraman, Advantest

Friday Keynote: “Present and Future SoC for Military Applications,” by Tommy Lam, Fellow, Lockheed Martin

Friday Invited Address by Prof. Amit Lal, PhD, Cornell University

Social Event: Awards banquet at the Greek Key restaurant, followed by a show “Sirens” at the Cider Mill Playhouse in Endicott

Jake Karrfalt Best Student Paper Award

To encourage student participation in the testing research community, NATW has sessions dedicated to student presentations and includes a Best Student Paper Award.

James Monzel Service Award: The award is issued to individuals for dedicated service to NATW. The 2013 recipient was J.C. Lo of URI, and the 2012 recipient was Charles Stroud.

Important Dates:

Early Registration: May 2, 2014

Room Reservation: May 1, 2014 

 
For general information, contact: Paul Reuter, Mentor Graphics Corp. 300 Nickerson Road, Suite 200, Marlborough, MA 01752, Phone: (508) 303-5669 Email: paul_reuter@mentor.com For program information,  contact:  Dr. Tian Xia, Program Chair, Electrical and Computer Engineering, University of  Vermont, Burlington, VT 05405, Phone: (802) 656-8996 Email: txia@uvm.edu

Corporate/Academic Supporter packages available for 2014