Welcome to the 2013 IEEE North Atlantic Test Workshop (NATW)
Sponsored by the IEEE Boston Section, and in Cooperation with Test Technology Technical Council (TTTC) and the IEEE Green Mountain Section
The TTTC is a volunteer professional organization sponsored by the IEEE Computer Society.
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled “VLSI Test and Security.” The program includes a keynote by Brian Gaucher (IBM) on Smart Power Grids and an invited address by Stephen Sunter (Mentor Graphics) on Analog/Mixed-signal Test. In addition to traditional topics, the 22nd NATW will feature a general theme of “Growing importance of Test and Hardware Security.”
Topics are not limited to, the following:
Analog, Mixed Signal & RF Testing
Built-In Self-Test (BIST)
Board Level Testing
Delay & Performance Testing
Diagnosis and Debug
FPGA & Embedded Core Testing
DFM, Defect Analysis & Defect-Based Testing
Memory & MEMS Testing
System-on-Chip (SoC) Test & Debug
Test Quality/System Reliability
Test Resource Partitioning
Testing for Soft Errors/Defects
The Program Committee invites authors to submit original, unpublished papers and panel proposals. Submissions may be in terms of extended summaries or full papers. Submissions must be emailed to the Program Chair (firstname.lastname@example.org) with the subject line “NATW 2013”. Detailed instructions for submission can be found at the “Author Information and Paper Submission” link http://natw.ieee.org. Papers found suitable for archival publication will be recommended by the program committee for submission to the “Journal of Electronic Testing: Theory and Applications (JETTA),” published by Springer.
Important Dates (call_for_papers_2013_natw):
Submission – 03/1/2013
Notification of acceptance – 03/29/2013
Submission of final papers – 04/19/2013
Submission of PPT presentations – 04/30/2013
Deadline for Hotel Reservation at group rate – April 17, 2013
Register at: https://www.ieeeboston.org/forms/natw/natw_form_pg/natw_form_pg.php
2013 NATW Technical Program now available
Jake Karrfalt Best Student Paper Award: To encourage student participation in the testing research community, NATW has sessions dedicated to student presentations and includes a Best Student Paper Award.
James Monzel Service Award: This award is issued to individuals for dedicated service to NATW.
For general information, contact:
Mentor Graphics Corp.
300 Nickerson Road, Suite 200
Marlborough, MA 01752
Phone: (508) 303-5669
For program information, contact:
Dr. Tian Xia, Program Chair
Electrical and Computer Engineering
University of Vermont
Burlington, VT 05405
Phone: (802) 656-8996
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